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研究發表 (PUBLICATION)

​吳俊緯 (Jim-Wei Wu) 助理教授

一、期刊論文 (JOURNAL)

  1. Jim-Wei Wu, Tzu-Lin Lee, You-Cheng Yan, Chuan-An Chou, and Cheng-Chang Ho*, “Mechanism Development and Pulse-Width Modulation Advanced Controller Design of Low Torque Manipulator,” IEEE Access, vol. 11, pp, 117110-117120, 2023. (SCI, IF=3.9).

  2. Jim-Wei Wu*, Shao-An Chao, and Ting-Kuei Hsu, “Design and Control of a Novel 3-D Piezoelectric Scanning Coaxial Optical Microscope System,” IEEE Transactions on Instrumentation and Measurement, vol. 72, 1002711 (11pp), 2023. (SCI, IF=5.6).

  3. Jim-Wei Wu*, Wen-Shan Cen, and Cheng-Chang Ho,"Numerical Simulation of Adaptive Radial Basis NN-Based Non-Singular Fast Terminal Sliding Mode Control with Time Delay Estimator for Precise Control of Dual-Axis Manipulator," Applied Sciences, 12(19), 9605 (17pp), 2022. (SCI, IF=2.7).

  4. Jim-Wei Wu*, Wei-Chih Liu, and Li-Chen Fu, “Novel Vertical Scanning Algorithm With Advanced Control to Increase Range and Accuracy of Differential Confocal Microscopy,” IEEE Transactions on Instrumentation and Measurement, vol. 71, 5013510 (10pp), 2022. (SCI, IF=5.6).

  5. Jim-Wei Wu*, Kuang-Yao Chang, and Li-Chen Fu, “Adaptive Under-Sampling Deep Neural Network for Rapid and Reliable Image Recovery in Confocal Laser Scanning Microscope Measurements,” IEEE Transactions on Instrumentation and Measurement, vol. 71, 1000309 (9pp), 2022. (SCI, IF=5.6).

  6. Jim-Wei Wu*, Yu-Ting Lo, Wei-Chih Liu, Da-Wei Liu, Kuang-Yao Chang, and Li-Chen Fu, “Adaptive Tilting Angles to Achieve the High-Precision Scanning of a Dual Probes AFM,” Asian Journal of Control, Vol. 20, No. 4, pp. 1339-1351, 2018. (SCI, IF=3.280).

  7. Jim-Wei Wu, Yi-Ting Lin, Yu-Ting Lo, Wei-Chih Liu, Kuang-Yao Chang, Da-Wei Liu, and Li-Chen Fu*, “Effective Tilting Angles for a Dual Probes AFM System to Achieve High-Precision Scanning,” IEEE/ASME Transactions on Mechatronics, vol. 21, no. 5, pp. 2512-2521, 2016. (SCI, IF=5.867).

  8. Jim-Wei Wu, Chii-Rong Yang*, and Che-Yi Huang, “Development of a novel plasma scanning technique for high-quality anodic bonding,” Journal of Micromechanics and Microengineering, 26, 045005 (10pp), 2016. (SCI, IF=2.280).

  9. Jim-Wei Wu, Yi-Ting Lin, Yu-Ting Lo, Wei-Chih Liu, and Li-Chen Fu*, “Lissajous Hierarchical Local Scan to Increase the Speed of Atomic Force Microscopy,” IEEE Transactions on Nanotechnology, vol. 14, no. 5, pp. 810-819, 2015. (SCI, IF=2.967). 

  10. Chih-Lieh Chen, Jim-Wei Wu, Yi-Ting Lin, Li-Chen Fu*, and Mei-Yung Chen, “Precision Sinusoidal Local Scan for Large Range Atomic Force Microscopy with Auxiliary Optical Microscopy,” IEEE/ASME Transactions on Mechatronics, vol. 20, no. 1, pp. 226-236, 2015. (SCI, IF=5.867). 

  11. Jim-Wei Wu, Jyun-Jhih Chen, Ming-Li Chiang, Jen-te Yu, and Li-Chen Fu*, “Design and Control of Phase-Detection Mode Atomic Force Microscopy for Reconstruction of Cell Contours in Three-Dimensions,” IEEE Transactions on Nanotechnology, vol. 13, no. 4, pp. 639-649, 2014. (SCI, IF=2.967). 

  12. Chii-Rong Yang, Jim-Wei Wu*, Long-Yin Chang “Design and implementation of a novel conical electrode for fast anodic bonding,” Journal of Micromechanics and Microengineering, 24, 105003 (8pp), 2014. (SCI, IF=2.280). 

  13. Jim-Wei Wu, Kuan-Chia Huang, Ming-Li Chiang, Mei-Yung Chen, and Li-Chen Fu*, “Modeling and Controller Design of a Precision Hybrid Scanner for Application in Large Measurement-Range Atomic Force Microscopy,” IEEE Transactions on Industrial Electronics, vol. 61, no. 7, pp. 3704-3712, 2014. (SCI, IF=8.162). 

  14. Jim-Wei Wu, Chii-Rong Yang*, Mao-Jung Huang, Cheng-Hao Yang, and Che-Yi Huang, “Realization of ultrafast and high-quality anodic bonding using a non-contact scanning electrode,” Journal of Micromechanics and Microengineering, 23, 075008 (9pp), 2013. (SCI, IF=2.280).

二、研討會論文 (CONFERENCE)

  1. Jim-Wei Wu, Yu-Chen Lin, Ko-Fan Teng, Chuan-An Chou, You-Cheng Yan, and Hang-Kai Ye, “A New Image Stitching Method with Entropy and Template Matching,” The 42nd IEEE International Conference on Consumer Electronics (ICCE 2024), Las Vegas, NV, USA, Jan. 5-8, 2024.

  2. Jim-Wei Wu, Shao-An Chao, Jui-Tse Weng, Wen-Shan Cen, and Shih-Hao Chien, “Design and Implementation of a 3D Optical Image Measurement System,” The 2023 International Conference on Fuzzy Theory and Its Applications (i-Fuzzy 2023), Penghu, Taiwan, Oct. 26-29, 2023.

  3. Jim-Wei Wu, You-En Wang, Ping-Hsuan Hsueh, and Chieh Yen, “Integration of MediaPipe and SIFT Technologies for Accurate Exercise Posture Recognition,” The 2023 Conference on Fuzzy Theory and Its Applications (Fuzzy 2023), Penghu, Taiwan, Oct. 26-29, 2023.

  4. Jim-Wei Wu, Wen-Shan Cen, Tzu-Lin Lee, Yu-Chen Lin, and Bo-Jun Chen, “Modeling and Advanced Controller for Precise Control of Dual- Axis Manipulator,” The 2022 International Conference on Fuzzy Theory and Its Applications (i-Fuzzy 2022), Garden Villa, Kaohsiung, Taiwan, Nov. 3-6, 2022.

  5. Jim-Wei Wu, Jui-Tse Weng, Ting-Kuei Hsu, Shao-An Chao, and Bo-Hao Chen, “Novel Control Design for Piezoelectric Stage to Achieve Fast and Precise Positioning of Spiral Trajectory,” The 2022 International Automatic Control Conference (CACS 2022),  Garden Villa, Kaohsiung, Taiwan, Nov. 3-6, 2022.

  6. Jim-Wei Wu, Cheng-Chia Wu, Wen-Shan Cen, Shao-An Chao, and Jui-Tse Weng, “Integrated Compressed Sensing and YOLOv4 for Application in Image-storage and Object-recognition of Dashboard Camera,” The 2021 Australian and New Zealand Control Conference (ANZCC 2021), Gold Coast, Australia Nov. 25-26, 2021.

  7. Jim-Wei Wu, Jui-Tse Weng, Shao-An Chao, Wen-Shan Cen, and Yuan-Chih Peng, “Design and Implementation of Multi-mode Scanning Atomic Force Microscope,” The 2021 International Automatic Control Conference (CACS 2021), Chiayi, Taiwan, Nov. 3-6, 2021.

  8. Da-Wei Liu, Huang-Chih Chen, Kuang-Yao Chang, Meng-Hao Chou, Yi-Lin Liu, Jim-Wei Wu, Ming-Li Chiang, and Li-Chen Fu, “Design of a High-speed and High-precision Hybrid Scanner with a New Path Planning Strategy Based on Spatial Entropy,” Proc. of American Control Conference, pp. 2946-2951, Milwaukee, WI, U.S.A., June 27-29, 2018.

  9. ​Kuang-Yao Chang, Da-Wei Liu, Meng-Hao Chou, Jim-Wei Wu, Yi-Lin Liu, and Li-Chen Fu, “A Fast CLSM Undersampling Image Reconstruction Framework with Precise Stage Positioning for Random Measurements,” The 2017 Asian Control Conference (ASCC 2017), Gold Coast, Australia, Dec. 17–20, 2017.

  10. Wei-Chih Liu, Jim-Wei Wu, Da-Wei Liu, Kuang-Yao Chang, Meng-Hao Chou, and Li-Chen Fu “A Self-Designed Laser Scanning Differential Confocal Microscopy with a Novel Vertical Scan Algorithm for Fast Image Scanning,” The 20th World Congress of the International Federation of Automatic Control (IFAC 2017), Toulouse, France, July 9-14, 2017.

  11. Wei-Chih Liu, Da-Wei Liu, Jim-Wei Wu, Kuang-Yao Chang, Meng-Hao Chou, and Li-Chen Fu “Precision Sinusoidal Tracking for Galvanometer Scanner with Smith Predictor-based Adaptive Sliding Mode Control,” The International Automatic Control Conference (CACS 2016), Taichung, Taiwan, Nov. 9-11, 2016. (Best Student Paper Award, Third Prize)

  12. Wei-Chih Liu, Kuang-Yao Chang, Jim-Wei Wu, Da-Wei Liu, Meng-Hao Chou, and Li-Chen Fu “A Galvanometer Scanner with Smith Predictor-based Controller for Fast Tracking,” The 2nd International Conference on Electrical Engineering and Computer Science (ICEECS 2016), Taipei, Taiwan, Oct. 28-29, 2016.

  13. Yu-Ting Lo, Jim-Wei Wu, Wei-Chih Liu, Da-Wei Liu, Kuang-Yao Chang, and Li-Chen Fu “Adaptive Tilting Angles for a Dual-Probe AFM System to Increase Image Accuracy,” The IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM), Banff, Alberta, Canada, July 12-15, 2016.

  14. Jim-Wei Wu, Yu-Ting Lo, Wei-Chih Liu, and Li-Chen Fu, “Lissajous Scan Trajectory with Internal Model Principle Controller for Fast AFM Image Scanning,” Proc. of the SICE Annual Conference, Hangzhou, China, July 28-30, 2015.

  15. Chii-Rong Yang, Richard JT Lin, Yu-En Chen, and Jim-Wei Wu, “Preparation of Graphene/diamond-like carbon composite films by atmospheric pressure chemical vapor deposition,” The 7th annual Recent Progress in Graphene and Two-dimensional Materials Research Conference (RPGR), Lorne, Victoria, October 25-29, 2015.

  16. Yi-Ting Lin, Yu-Ting Lo, Jim-Wei Wu, and Li-Chen Fu, “A Dual Probes AFM System with Effective Tilting Angles to Achieve High-Precision Scanning,” Proc. of 53st IEEE Conference on Decision and Control, Los Angeles, California, Dec. 15-17, 2014.

  17. C. R. Yang, S. S. Wu, and J. W. Wu, “Fabrication of a Graphene/conductive nanofibers based electrochemical capacitor via electrospinning and electrospray,” The 6th international conference on recent progress in graphene research (RPGR), 21-25 Sep. 2014, Taipei, Taiwan, PH-01, 2014.

  18. C. R. Yang, S. C. Chang, T. P. Teng, and J. W. Wu, “Preparation of high-quality graphene sheets under electrochemical/mechanical hybrid exfoliation,” The 6th international conference on recent progress in graphene research (RPGR), Sep. 21-25, 2014, Taipei, Taiwan, PA-10, 2014.

  19. Chih-Lieh Chen, Jim-Wei Wu, Yi-Ting Li, and Li-Chen Fu, “Precision Sinusoidal Local Scan for Large Range Atomic Force Microscopy with Auxiliary Optical Microscopy,” Proc. of 52st IEEE Conference on Decision and Control, Florence, Italy, Dec. 10-13, 2013.

  20. Jim-Wei Wu, Jyun-Jhih Chen, Kuan-Chia Huang, Chih-Lieh Chen, Yi-Ting Lin, Mei-Yung Chen, and Li-Chen Fu, “Design and Control of Phase-Detection Mode Atomic Force Microscopy for Cells Precision Contour Reconstruction under Different Environments,” Proc. of American Control Conference, Washington DC, USA, June 17-19, 2013.

  21. Jim-Wei Wu and Chii-Rong Yang, “Development of a Novel Ultrafast Anodic Bonding Technique,” The 17th Nano and Microsystem Technology Conference, Taichung, Taiwan, August 22-23, 2013.

  22. Kuan-Chia Huang, Jim-Wei Wu, Jyun-Jhih Chen, Chih Lieh Chen, Mei-Yung Chen, and Li-Chen Fu, “Development of a Large Scanning-range Atomic Force Microscope with Adaptive Complementary Sliding Mode Controller,” Proc. of 51st IEEE Conference on Decision and Control, Hawaii, USA, Dec. 10-13, 2012.

  23. Jim Wei Wu, Yuan-Zhi Peng, Jyun-Jhih Chen, Kuan-Chia Huang, Mei-Yung Chen, Li-Chen Fu, “Design and Implementation of a Large Measurement-range AFM Scanning System,” Proc. of American Control Conference, Montreal, Canada, June 27-29, 2012.

  24. Yuan-Zhi Peng, Jim-Wei Wu, Kuan-Chia Huang, Jyun-Jhih Chen, Mei-Yung Chen, and Li-Chen Fu, “Design and Implementation of an Atomic Force Microscope with Adaptive Sliding Mode Controller for Large Image Scanning,” Proc. of 50th IEEE Conference on Decision and Control, Orlando, Florida, USA, December 12-15, 2011.

  25. Kuan-Lin Huang, Yuan-Zhi Peng, Jim-Wei Wu, Mei-Yung Chen, and Li-Chen Fu, “Design and Implementation of an Electromagnetically Damped Positioner with Flexure Suspension.,” Proc. of IEEE Multi-Conference on Systems and Control, Denver, USA, September 28-30, 2011.

  26. Jim-Wei Wu, Mei-Yung Chen, Shao-Kang Hung, Li-Chen Fu, “A Compact Tapping Mode AFM with Sliding Mode Controller for Precision Image Scanning,” Proc. of 8th Asian Control Conference, Kaohsiung, Taiwan, May 15-18, 2011.

  27. Shan-Tsung Lee, Kuan-Lin Huang, Jim-Wei Wu, and Li-Chen Fu, “Design and Control of Long Travel Range Electromagnetically Actuated Positioning Stage with Application to Precise Machining,” Proc. of IEEE Multi-Conference on Systems and Control, pp.2219-2224, Yokohama, Japan, September, 8-10, 2010.

  28. Shih-Hsun Yen, Jim-Wei Wu, and Li-Chen Fu, “Apply Tapping Mode Atomic Force Microscope with CD/DVD Pickup Head in Fluid,” Proc. of American Control Conference, pp. 6549-6554, Baltimore, MD, U.S.A., June 30-July 2, 2010.

三、專利 (PATENT)

  1. Inventor: Jim-Wei Wu, Li Tseng, Chia-Hsun Chang, Wen-Chih Wang, and Keith Kuang-Kuo Koai;  Title: Apparatus for Polarizing a Semiconductor Wafer and Method for Fabricating a Magnetic Semiconductor Device; US Patent #10,868,241; December 15, 2020. (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.)

  2. 發明人: 吳俊緯、曾瓅、張家熏、王文志、蒯光國; 發明名稱: 极化半导体晶片的装置和制造磁性半导体装置的方法; CN Public  #111952443A, 2020-11-17. (台湾积体电路制造股份有限公司)

  3. 發明人/Inventor: 傅立成、吳俊緯、林奕廷、羅宇廷、劉韋志; 發明名稱/Title : 原子力顯微鏡掃描方法/ SCANNING METHOD FOR AN ATOMIC FORCE MICROSCOPY; Patent Pending No. : I 582429; 2017/05/11. (國立臺灣大學)

  4. 發明人/Inventor: 傅立成、吳俊緯、陳志烈、林奕廷、羅宇廷; 發明名稱/Title : 用於一光學輔助原子力顯微鏡系統的掃描樣本的方法及其裝置/ METHOD OF SCANNING SAMPLE FOR ATOM FORCE MICROSCOPE SYSTEM; Invention Patent No. : I 519197; 2016/02/01. (國立臺灣大學)

  5. 發明人/Inventor: 楊啟榮、范志文、黃孟書、吳俊緯、張淑芳; 發明名稱/Title : 一種模組化壓床設備/A PRESS MACHINE AND A MODULE; Invention Patent No. : I 331082, 2010/10/01. (國立臺灣師範大學)

  6. 發明人/Inventor: 楊啟榮、吳俊緯、張淑芳; 發明名稱/Title : 一種陽極接合方法與設備/ A METHOD AND EQUIPMENT FOR ANODIC BONDING; Invention Patent No. : I 308135; 2009/04/01. (國立臺灣師範大學)

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